University of the West of Scotland
Thin Film Centre
High Street
Paisley
PA1 2BE
+44 (0)141 848 3610
frank.placido@uws.ac.uk
Hitachi S4100 field emission microscope. Used for high
resolution imaging of surfaces and cross-sections of thin films. Oxford
Instruments ISIS EDX system with germanium detector. The detector is
fitted with a Super Atomic Thin Window capable of passing low energy
x-rays. Used for qualitative and quantitative chemical analysis of solid
materials. All elements from boron to uranium can be detected.
Scanning Electron Microscope image of defect in a
rugate filter.
