THIN FILM CENTRE
University of the West of Scotland
Thin Film Centre
High Street
Paisley
PA1 2BE
+44 (0)141 848 3610 frank.placido@uws.ac.uk
 
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 AFM
 
Digital Instruments Nanoscope III atomic force microscope.
  • Used for imaging of surfaces
  • Gives topographic information from metals and insulators
125 x 125 micron scanning range on sample surface 5 micron height range.
Roughness Analysis
 
Ellipsometer AFM CVC SEM Microdyn E-beam Sub_One system